4 research outputs found

    Model-Based Edge Detector for Spectral Imagery Using Sparse Spatiospectral Masks

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    Two model-based algorithms for edge detection in spectral imagery are developed that specifically target capturing intrinsic features such as isoluminant edges that are characterized by a jump in color but not in intensity. Given prior knowledge of the classes of reflectance or emittance spectra associated with candidate objects in a scene, a small set of spectral-band ratios, which most profoundly identify the edge between each pair of materials, are selected to define a edge signature. The bands that form the edge signature are fed into a spatial mask, producing a sparse joint spatiospectral nonlinear operator. The first algorithm achieves edge detection for every material pair by matching the response of the operator at every pixel with the edge signature for the pair of materials. The second algorithm is a classifier-enhanced extension of the first algorithm that adaptively accentuates distinctive features before applying the spatiospectral operator. Both algorithms are extensively verified using spectral imagery from the airborne hyperspectral imager and from a dots-in-a-well midinfrared imager. In both cases, the multicolor gradient (MCG) and the hyperspectral/spatial detection of edges (HySPADE) edge detectors are used as a benchmark for comparison. The results demonstrate that the proposed algorithms outperform the MCG and HySPADE edge detectors in accuracy, especially when isoluminant edges are present. By requiring only a few bands as input to the spatiospectral operator, the algorithms enable significant levels of data compression in band selection. In the presented examples, the required operations per pixel are reduced by a factor of 71 with respect to those required by the MCG edge detector

    Canonical Correlation Feature Selection for Sensors with Overlapping Bands: Theory and Application

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    The main focus of this paper is a rigorous development and validation of a novel canonical correlation feature- selection (CCFS) algorithm that is particularly well suited for spectral sensors with overlapping and noisy bands. The proposed approach combines a generalized canonical correlation analysis framework and a minimum mean-square-error criterion for the selection of feature subspaces. The latter induces ranking of the best linear combinations of the noisy overlapping bands and, in doing so, guarantees a minimal generalized distance between the centers of classes and their respective reconstructions in the space spanned by sensor bands. To demonstrate the efficacy and the scope of the proposed approach, two different applications are considered. The first one is separability and classification analysis of rock species using laboratory spectral data and a quantum-dot infrared photodetector (QDIP) sensor. The second application deals with supervised classification and spectral unmixing, and abundance estimation of hyperspectral imagery obtained from the Airborne Hyperspectral Imager sensor. Since QDIP bands exhibit significant spectral overlap, the first study validates the new algorithm in this important application context. The results demonstrate that proper postprocessing can facilitate the emergence of QDIP-based sensors as a promising technology for midwave- and longwave-infrared remote sensing and spectral imaging. In particular, the proposed CCFS algorithm makes it possible to exploit the unique advantage offered by QDIPs with a dot-in-a-well configuration, comprising their bias-dependent spectral response, which is attributable to the quantum Stark effect. The main objective of the second study is to assert that the scope of the new CCFS approach also extends to more traditional spectral sensors

    Multispectral Classification With Bias-Tunable Quantum Dots-in-a-Well Focal Plane Arrays

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    Mid-wave and long-wave infrared (IR) quantum-dots-in-a-well (DWELL) focal plane arrays (FPAs) are promising technology for multispectral (MS) imaging and sensing. The DWELL structure design provides the detector with a unique property that allows the spectral response of the detector to be continuously, albeit coarsely, tuned with the applied bias. In this paper, a MS classification capability of the DWELL FPA is demonstrated. The approach is based upon: 1) imaging an object repeatedly using a sequence of bias voltages in the tuning range of the FPA and then 2) applying a classification algorithm to the totality of readouts, over multiple biases, at each pixel to identify the “class” of the material. The approach is validated for two classification problems: separation among different combinations of three IR filters and discrimination between rocks. This work is the first demonstration of the MS classification capability of the DWELL FPA
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